Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

Image Metrology are leading suppliers of SPM image processing software; which they have been supplier to scientists in both academia and industry over the last two decades. AZoNano spoke to their ...

Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

Discover everything there is to know about reverse tip sample scanning probe microscopy (RTS SPM) and its main applications. The biggest challenge with SPM is that the SPM data quality is inherently ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in ...

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PI (Physik Instrumente) L.P. – a leading manufacturer of piezo nanopositioning systems and scanners for microscopy, bio-medical and nanotechnology applications – has released a new catalog on planar ...

Conventional microscopy cannot resolve some cellular structures, and does not capture three-dimensional features of the sample. The connectivity of local networks of neurons is an example of ...

The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...