Optimize SEM analysis with Broad Ion Beam Milling, a cutting-edge technique for preparing intricate specimens, ensuring ...

Tabletop SEMs, particularly the TM4000 Series, revolutionize electron microscopy by offering high-resolution imaging and user ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope TM, ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

Experience advanced SEM imaging with exceptional clarity and detail, all in a space saving design ideal for labs and research ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...

Unlock new insights with cathodoluminescence imaging in a benchtop SEM, enabling advanced material characterization.

The Thermo Fisher Apreo 2 Variable Pressure Field Emission Scanning Electron Microscope (FE-SEM) is a thermionic field emission high-resolution scanning electron microscope. The Apreo 2 FE-SEM is an ...

Nanofibers have gained significant attention for different applications, such as barrier fabrics and high-efficiency filters. In biomedical applications, nanofibers have been used as drug delivery ...

CD-SEM, the workhorse metrology tool used by fabs for process control, is facing big challenges at 5nm and below. Traditionally, CD-SEM imaging has relied on a limited number of image frames for ...