Abstract: Observations of heavy ion and proton induced single event effects on the LTC311S-1 DC/DC converter were made. The DC/DC converter was sensitive to SEE including SET and DSEE.
Abstract: We present the single-event upset (SEU) laser testing of different static random access memory (SRAM) resources of a 7-nm fin field-effect transistor (FinFET) programmable system-on-chip ...
Brazilian scientists create a cork sensor that detects nitrite in beverages, revealing hidden risks to food safety.
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